Viscom S2012PV

Steadily rising demands for quality in solar cells and wafers require fast and effective optical characterization systems.

The S2012PV offers the base for a comprehensive AOI system for solar cell inspection. All applications such as control of incoming wafers (geometry, cracks, color), cell characterization (geometry, print, cracks, color), and cell final inspection (geometry, print, cracks, color, micro cracks) are covered by the Viscom image processing concept – with especially high inspection depth.

The high performance VisCam camera technology can be modularly adapted to each inspection stage and for every characterization task. It guarantees consistently good quality for cell production.

The AOI system S2012PV can be integrated into the production environment with remarkable ease. The sophisticated calibration concept ensures genuine dimensional accuracy and reproducibility for all inspection assignments.

Highlights:

Fast, objective and reproducible analysis
Applicable to numerous inspection tasks
Robust defect recognition at line pace
Refined calibration concept for genuine measurement accuracy and lasting reproducibility of all inspection tasks
Viscom VMC user interface for simple operation
Easy integration into existing processes
Entire image evaluation at highest resolution
Color classification

Click on the following picture in order to show the S2012PV product brochure (PDF format):

The programs of this machine can be used on any other of the Viscom AXI machines.